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Isodynamique Group of Company (All rights reserved)




Scanning Acoustic Microcope
SAM VEGA

SAM DENEB


For Semiconductor
A Scanning Acoustic Microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called Scanning Acoustic Tomography). It is commonly used in failure analysis and non-destructive evaluation. It also has applications in biological and medical research. The semiconductor industry has found the Scanning Acoustic Microscope useful in detecting voids, cracks, and delaminations within microelectronic packages.


Flip chip
Application

Semiconductor
Stack Die
BGA
QFT
BGA

Industrial
Welding
ITO Target
Composite
Spot Weld
Diamond Bite

Others
Phase Array
TOFD
CT for Woods
Sounds pressure
SAM DENEB is the most economical model for production and QA with top quality and performance. Scanning area is 350 mm X 250 mm that is covered most of the semiconductor products. It's teh best choice for small budget customer
SAM VEGA is standard model for production. QA and failure analysis with top quality adn performance. There are motorized slide door and auto loading/unloading mechanism for friendly user interface. Scanning area is 330 mm X 190 mm that is covered most of the semiconductor products.
SAM VEGA is large module for production and QA and failure analysis with top quality and performance. It's designed for large PCB inspection. There are water jet scan for non-imersion scanning with air blower and bath up/down mechanism. Scanning area is 750mm x 750 mm that is covered most most of semiconductor and PCB products.
SAM TITAN

For Industrial
3-axis immersion type
6-axis immersion type
L4, L6 and V6 AL Engine
Hydo Induced Crack