Inspection Microscope for Semiconductor and Microelectronics
INM 100

INM 100 with Nikon Wafer Loader
Leica INM100

Key Features


The NWL-860 series provides a full range of macro inspection capabilities — one of the features considered most essential for inspecting semiconductor patterns with progressively higher steps and ever-increasing layers. A single cassette wafer loader capable of handling 6 and 8-inch (150 and 200 mm) wafers, this series of wafer loaders is not only available with pattern side macro inspection capability, but also with the ability to perform back side periphery and center macro inspections as well.


Key Feature